SIMS

 


Instrument Introduction:

Date of Purchase: 2003. 06
Date of Service: 2004. 02
Sources of the funds:
National Science Council (NSC) and
National Cheng-Kung University (NCKU)
Factory and Model: France Cameca, IMS-6f
Significant Specifications:
Fan-shaped and magnetic filed mass spectrometer; Ion sources O2+, Cs+ ; Resolution ≒ 10,000 ; Range of Mass ≒300
Major Attachments:
Sun Computer System
Electron Gun System
CCD Camera System
Function of Instrument:
The depth profile and surface analysis of the elements
1. Items of Service:
A.General Service:
a.Surface Analysis
b.Depth Profile Analysis
2. Application Method:
General Service:

Please send the sample and application form to SIMS Lab. After check the sample, we will start service in turn. Please fill out the application form in detail, if not, the sample will be rejected. Due to the untruthful information of application form, which makes the instrument broken, we will request the user to compensate all cost.

Sample Specifications:

User must process the sample by yourself. The sample specification should be a solid. The length and width are 0.6cm. The thickness is smaller than 0.2 cm. The sample surface must be smooth without magnetism, explosion, inflammable, corrosiveness, radiation, virulence, and volatility. Every sample must be put in the sample box separately and the sample must be marked the name and serial number.

Attention:

Please state the structure, thickness, and concentration of the sample and explain the key point of the measurement for convenience to set analysis condition.

3.Charge Criterion:
The used time of the instrument is from the sample put into the chamber to the experiment completed. One hour is defined as one basic unit.
The charge of each basic unit is $3,000. The charge of the depth profile experiment is $5,000. If the samples are needed to use other ion sources, the schedule and charge will be arranged extra.
4.Estimated time of accomplishment:
Normally, user can get the results about one month later. If the numbers of the samples are too many or the samples are special specifications, the schedule of service will be delayed.

Mis. Hung-Jung Shih
Tel: (06)2353535-62460
E-mail: z7306007@email.ncku.edu.tw
Lab. of Secondary Ion Mass Spectrometer, B1 Department of Electrical Engineering Building, National Cheng Kung University

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