FE-SEM

 

Ultra High Resolution Field Emission Scanning Electron Microscope

The instrument is combined the GEMINI ultra high resolution Field Emission Scanning Electron Microscope(FE-SEM)with the sophisticated high performance Focused Ion Beam column(FIB) and an Energy Dispersive Spectrometer(EDS)into one extraordinary powerful system. The special in-lens SE and BSE detectors of GEMINI FE-SEM offer high-resolution image quality and excellent material contrast. The EDS can make qualitative and quantitative analysis of composition of materials.


Service item

1. SEI image:It is high resolution which observe the microstructure.

2. BEI-COMPO image:The composition of materials analysed.

3. BEI-TOPO image:The observes of morphology.

4. EDS:The qualitative and semi-quantitative analysis.



 

 

 

 

 

 

Precautions that take a sample

1. The diameter of specimen does not exceed 50 mm, and the height don't exceed 20 mm.
2. If specimens are the nonmetal or powder, please do regularly and coated with gold.
3. This instrument doesn't accept that specimen contains toxicity, corrosive, volatility, magnetism and low meltpoint.

 

 

 

 

 

Charge way and standard

1. Every operation unit charges the basic use fee 3500 NT$ of period within 1 hour and 45minutes.
2. EDS analysis:200 NT$/once.

Counselor: professor Li Hwa-Ten (06)2757575 ext. 62154
E-mail:htlee@mail.ncku.edu.tw
Technician: Miss Liu.
(06)2757575 ext. 31373
E-mail:z10508127@email.ncku.edu.tw
Site
NCKU Tzu-Chiang compus. Room 0206, Second floor, Instrument building.

BACK