Ultrahigh-Resolution Analytical Electron Microscope
ThInstrument Model: JEOL JEM-2100F The Cs Corrector STEM is a new generation advanced field emission spherical aberration correction scanning and transmission electron microscope that features ultra-high resolution and rapid data collection, providing materials science atomic level analysis The full range of functions.
Specifications: 200Kv Scheeky field emission electron source, CEOS spherical aberration correction function, Oxford EDS System energy dispersive spectrum analyzer, Gatan Enfina1 EELS electron energy loss spectrum analyzer, HAADF and STEM detector.
Electron beam quality is stable, as small as 0.12nm, observation resolution up to 0.1nm, various observations and chemical analysis of nanoscale materials or analysis of compound crystal structure, defect structures of various lattices, intergranular boundaries or phases The analysis of the atomic-scale ultra-microstructure between the phases can be accomplished by this set of equipment.
