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HRA-SEM

 

Ultra-high resolution field-emission Scanning Electron Microscope with EDS and EBSD


　　This instrument combines with HITACHI SU-5000 Thermal Field Efficient High Resolution Field Emission Scanning Electron Microscope(HR-SEM), EDAX Energy Dispersive Spectroscopy (EDS) and Electron backscatter diffraction (EBSD). It can be used as a surface image of Morphology observation, semi-quantitative analysis, elemental distribution analysis, etc.,（Since 2016 Dec.）

Specification of the instrument

（1）Hot field filament ( Schottky emitter )

（2）SEI resolution 1.2.nm @ 30kv

（3）EDS detects from B（5）to U（92）Resolution: 125ev

Service

1. The image is observed and taken pictures:

(1)SEI image :

(2)BEI image :

2. EDS analysed:

3. EBSD
Note：The instrument rejects moisture content, magnetic, corrosion, low-melting (polymer) , mounting, volatile, contaminating and infectious samples.

Charge

(1) The basic use fee：2000 NT$/hr.

(2) SEM electronic image : 30 NT$/piece.

(3) EDS analysis : 200 NT$/once.

(4) EBSD: 2000 NT$/once area.

(5) Coating with gold : 400 NT$/once.

Contact
Professor Lee(06)2757575 ext. 62154 htlee@mail.ncku.edu.tw

Mr.Huang(06)2757575 ext. 31359 a62123@mail.ncku.edu.tw

Site
NCKU Tzu-Chiang compus

Room 0206, Second floor, Instrument building.

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